NISC Center would like to congratulate Eng. Ahmed Ammar and Dr. Rafik Guindi for their accepted papers in the IEEE International System-on-Chip Conference (SOCC), in Beijing, China.
 A. M. Ammar, R. Guindi, E. Shih, C. Tokunaga, J. Tschanz, and M. Khellah, “A Fully Integrated Charge Sharing Active Decap Scheme for Power Supply Noise Suppression”, IEEE International System-on-Chip Conference (SOCC), Sep. 2015.
Power supply noise has become a major challenge for proper operation of circuits with continuous scaling of CMOS technology along with supply voltage scaling. Conventional passive decoupling capacitors exhibit significant die area penalty resulting in a limited regulation effect. This paper presents a fully integrated charge-sharing-based active decap scheme for power supply noise suppression. The proposed idea is based on allocating a portion of the available passive decap to be used as an active decap that is charged up to a higher voltage and shares its boosted charge with the noisy rail upon droop detection. The proposed scheme uses a charge pump for providing the higher voltage node, as well as a detector circuit for droop detection. The system is implemented in 32 nm CMOS process, and achieves up to ~47% worst-case droop reduction with reduced ringing and settling time, at minimal area and power penalties.